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Experimental Measurement of Minority Carriers Effective Lifetime in Silicon Solar Cell Using Open Circuit Voltage Decay under Magnetic Field in Transient Mode

Experimental Measurement of Minority Carriers Effective Lifetime in Silicon Solar Cell Using Open Circuit Voltage Decay under Magnetic Field in Transient Mode

Alain Diasso1, Raguilignaba Sam1,2, Bernard Zouma3, François Zougmoré1
URI: ${sadil.baseUrl}/handle/123456789/2020
Date: 2020

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