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Experimental Measurement of Minority Carriers Effective Lifetime in Silicon Solar Cell Using Open Circuit Voltage Decay under Magnetic Field in Transient Mode
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| dc.contributor.author | Alain Diasso1, Raguilignaba Sam1,2, Bernard Zouma3, François Zougmoré1 | |
| dc.date.accessioned | 2021-12-12T07:32:58Z | |
| dc.date.available | 2021-12-12T07:32:58Z | |
| dc.date.issued | 2020 | |
| dc.identifier.uri | ${sadil.baseUrl}/handle/123456789/2020 | |
| dc.title | Experimental Measurement of Minority Carriers Effective Lifetime in Silicon Solar Cell Using Open Circuit Voltage Decay under Magnetic Field in Transient Mode | |
| dc.type | Journal |
